X-ray metrology for semiconductors

Precision measurement of thin-film structures.

Expert and consulting services in X-ray diffraction (XRD) and X-ray reflectivity (XRR) for semiconductors and thin-film systems — measurement, analysis, method design and training.

Services

Focused capabilities across the full (HR-)XRD/XRR workflow.

01

XRD & XRR measurements

Expert and consulting services for high-resolution X-ray diffraction and X-ray reflectivity measurements of semiconductors and thin-film structures.

02

Data analysis & method design

Quantitative analysis of measurement data and design of measurement methods tailored to your samples and goals.

03

Training services

Hands-on training for measurement teams and analysts working with XRD and XRR techniques.

About

ApiBara Semiconductor is an independent sole-trader based in Helsinki, Finland. ApiBara Semiconductor provides specialist expertise in X-ray diffraction and X-ray reflectivity measurements of semiconductors and thin-film structures, together with data analysis, method design, and training.

Contact

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